Pay in 4 interest-free payments of $48.25 Learn more
Ships within 48 hours · Estimated delivery Aug 7 - Aug 12
300 mmロードポート （SEMI E15
such as counter-doping by organophosphorus compounds
device manufacturer
SEMI M12-0706 (Reapproved 1011)
homogeneous layers of
M04600 - SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling StdPbc-0326 300 mmロードポート （SEMI E15NOTICE: This Document was reapproved with minor editorial changes. The purpose of this Document is to specify a method to measure the carrier concentration and carrier concentration vs. depth profile of epitaxial layers by electrochemical capacitance voltage (ECV) profiling. This Test Method covers a procedure for measuring the carrier concentration of epitaxial layers by ECV profiling. This method focuses on improving the accuracy and repeatability
US$ 19.99
US$ 224.50
US$ 19.99
US$ 65.99
US$ 404.45
US$ 267.95
US$ 735.95
US$ 210.45
US$ 23.97
US$ 17.97
US$ 173.99
US$ 169.00
